%0 Journal Article
%@holdercode {isadg {BR SPINPE} ibi 8JMKD3MGPCW/3DT298S}
%@nexthigherunit 8JMKD3MGPCW/3ESR3H2
%@archivingpolicy denypublisher denyfinaldraft12
%@issn 0103-9733
%@resumeid 8JMKD3MGP5W/3C9JGJU
%@resumeid 8JMKD3MGP5W/3C9JJ37
%@resumeid
%@resumeid 8JMKD3MGP5W/3C9JJ39
%@resumeid 8JMKD3MGP5W/3C9JGUH
%@usergroup administrator
%@usergroup marciana
%3 mbe.pdf
%X Epilayers of Sn1¡xEuxTe (0 < x < 0:03) were grown by molecular beam epitaxy on freshly cleaved BaF2(111) substrates and their structural, electrical and optical properties were investigated. The thicknesses of epilayers were about 1.5 ¹m and deposition was carried out at growth temperatures of 300 oC. The structural properties were investigated by high resolution X-ray diffraction and a sharp film degradation could be observed with increasing europium content. Electrical measurements with temperature varying from 300 to 10K indicated that the epilayers present carrier concentration ranging between 3 £ 1020 and 6 £ 1020cm¡3 and a low resistivity from 6:3 £ 10¡5 to 1:2 £ 10¡4 ­.cm. From optical measurements it could be seen that spectra present a low energy edge corresponding to the beginning of intra band excitations and the high energy edge due to inter band excitations.
%8 June
%N 2B
%T MBE Growth and Characterization of Sn1¡xEuxTe
%@secondarytype PRE PN
%K MATERIALS PHYSICS, MBE, Growth, FÍSICA DE MATERIAIS, Cresicmento.
%@visibility shown
%@group LAS-INPE-MCT-BR
%@group LAS-INPE-MCT-BR
%@group LAS-INPE-MCT-BR
%@group LAS-INPE-MCT-BR
%@group LAS-INPE-MCT-BR
%@secondarykey INPE-10990-PRE/6446
%@copyholder SID/SCD
%2 sid.inpe.br/marciana/2004/07.26.10.40.54
%@affiliation Instituto Nacional de Pesquisas Espaciais, Laboratório Associado de Sensores e Materiais (INPE.LAS)
%@affiliation Instituto Nacional de Pesquisas Espaciais, Laboratório Associado de Sensores e Materiais (INPE.LAS)
%@affiliation Instituto Nacional de Pesquisas Espaciais, Laboratório Associado de Sensores e Materiais (INPE.LAS)
%@affiliation Instituto Nacional de Pesquisas Espaciais, Laboratório Associado de Sensores e Materiais (INPE.LAS)
%@affiliation Instituto Nacional de Pesquisas Espaciais, Laboratório Associado de Sensores e Materiais (INPE.LAS)
%@affiliation Escola Preparatória de Cadetes do Ar (EPCAR)
%@affiliation Universidad de São Paulo, Instituto de Física (USP)
%@affiliation Universidad de São Paulo, Instituto de Física (USP)
%@affiliation Universidad de São Paulo, Instituto de Física (USP)
%@affiliation Institut für Halbleiterphysik, Universität Linz
%@project TECMAT: Tecnologia de materiais
%B Brazilian Journal of Physics
%P 672-674
%4 sid.inpe.br/marciana/2004/07.26.10.40
%D 2004
%V 34
%A Ueta, Antonio Yukio,
%A Rappl, Paulo Henrique de Oliveira,
%A Closs, Humberto,
%A Motisuke, Paulo,
%A Abramof, Eduardo,
%A Anjos, Vanderlan Rodrigues dos,
%A Chitta, V. A.,
%A Coaquira, J. A.,
%A Oliveira Jr, N. F.,
%A Bauer, G.,
%@dissemination WEBSCI; PORTALCAPES; SCIELO.
%@area FISMAT