%0 Journal Article
%@holdercode {isadg {BR SPINPE} ibi 8JMKD3MGPCW/3DT298S}
%@nexthigherunit 8JMKD3MGPCW/3ESR3H2
%@archivingpolicy denypublisher denyfinaldraft12
%@resumeid
%@resumeid 8JMKD3MGP5W/3C9JGUH
%@resumeid 8JMKD3MGP5W/3C9JJ39
%@resumeid 8JMKD3MGP5W/3C9JJ37
%@resumeid
%@resumeid 8JMKD3MGP5W/3C9JGJU
%@resumeid 8JMKD3MGP5W/3C9JGRJ
%@resumeid 8JMKD3MGP5W/3C9JHDG
%@usergroup administrator
%@usergroup marciana
%@usergroup sergio
%3 band crossing.pdf
%X Using high quality epitaxial layers, we have obtained direct evidence of the band inversion in the Pb1 Te system. The samples, covering the whole composition range, were grown by molecular beam epitaxy on (111)BaF2 substrates. A minimumin the resistivity as a function of temperature was observed for all samples with Sn composition 0:35  x  0:70. In the same samples and at the same temperature, temperature dependent optical transmission measurements have revealed a change in signal of the energy gap temperature derivative, a direct evidence of the band inversion. However, the temperature for which the inversion occurs is not the one expected by the band inversion model. This discrepancy is supposed to be due to the Burstein-Moss shift caused by the relatively high hole concentration observed in these sample.
%8 Dec.
%N 4
%T Band Crossing Evidence in PbSnTe Observed by Optical Transmission Measurements
%@secondarytype PRE PN
%K SENSORS AND MATERIALS, Epitaxy, Burstein-Moss, Temperature, SENSORES E MATERIAIS, Epitáxia, Temperatura.
%@visibility shown
%@group
%@group LAS-INPE-MCT-BR
%@group LAS-INPE-MCT-BR
%@group LAS-INPE-MCT-BR
%@group LAS-INPE-MCT-BR
%@group LAS-INPE-MCT-BR
%@group LAS-INPE-MCT-BR
%@group LAS-INPE-MCT-BR
%@secondarykey INPE-11816-PRE/7169
%@copyholder SID/SCD
%@issn 0103-9733
%2 sid.inpe.br/marciana/2004/12.13.15.05.34
%@affiliation Universidade Federal de Viçosa, Departamento de Física
%@affiliation Instituto Nacional de Pesquisas Espaciais, Laboratório Associado de Sensores e Materiais (INPE.LAS)
%@affiliation Instituto Nacional de Pesquisas Espaciais, Laboratório Associado de Sensores e Materiais (INPE.LAS)
%@affiliation Instituto Nacional de Pesquisas Espaciais, Laboratório Associado de Sensores e Materiais (INPE.LAS)
%@affiliation Instituto Nacional de Pesquisas Espaciais, Laboratório Associado de Sensores e Materiais (INPE.LAS)
%@affiliation Instituto Nacional de Pesquisas Espaciais, Laboratório Associado de Sensores e Materiais (INPE.LAS)
%@affiliation Instituto Nacional de Pesquisas Espaciais, Laboratório Associado de Sensores e Materiais (INPE.LAS)
%@affiliation Instituto Nacional de Pesquisas Espaciais, Laboratório Associado de Sensores e Materiais (INPE.LAS)
%@project TECMAT: Tecnologia de Materiais
%B Brazilian Journal of Physics
%P 771-774
%4 sid.inpe.br/marciana/2004/12.13.15.05
%D 1999
%V 29
%A Ferreira, S. O.,
%A Abramof, Eduardo,
%A Motisuke, Paulo,
%A Rappl, Paulo Henrique de Oliveira,
%A Closs, Humberto,
%A Ueta, Antonio Yukio,
%A Boschetti, Cesar,
%A Bandeira, Iraja Newton,
%@dissemination WEBSCI; PORTALCAPES; SCIELO.
%@area FISMAT