%0 Journal Article %@holdercode {isadg {BR SPINPE} ibi 8JMKD3MGPCW/3DT298S} %@nexthigherunit 8JMKD3MGPCW/3ESGTTP %@archivingpolicy denypublisher denyfinaldraft24 %@resumeid %@resumeid %@resumeid 8JMKD3MGP5W/3C9JJ5D %@usergroup administrator %@usergroup simone %3 optical and morphological properties.pdf %X Porous diamond-like-carbon (PDLC) thin films obtained on silicon substrate by DC low energy magnetron sputtering have been investigated by photoluminescence, transmission and reflection spectroscopy, photoacoustic and spectroscopic ellipsometry. The absorption features observed for these films show similarities with those of porous silicon (PS) as well as in the performed gradient structural pattern classification of the SFM porosity, by means of the computational GPA-flyby environment on PS and PDLC samples. The dielectric function is also calculated for the bulk diamond-like carbon using the full-potential linearized augmented plane wave method within the framework of local density approximation to density functional theory. From the measurement a low real dielectric constant of about 4.5 at 0.8 eV was found whereas the calculated e1(0) for the bulk diamond has a value of 5.5. %8 Sept %N 32/35 %T Optical and morphological properties of porous diamond-like-carbon films deposited by magnetron sputtering %@electronicmailaddress mariana@lac.inpe.br %@secondarytype PRE PI %K Modeling and simulation, Optical properties, Thermal properties, ASYMMETRIC FRAGMENTATION PATTERNS, SILICON. %@group LAC-INPE-MCT-BR %@group %@group LAC-INPE-MCT-BR %@secondarykey INPE-14301-PRE/9389 %@copyholder SID/SCD %@issn 0022-3093 %2 sid.inpe.br/mtc-m16@80/2006/11.22.16.55.14 %@affiliation Instituto Nacional de Pesquisas Espaciais (INPE) %@affiliation Grupo de Física Básica e Aplicada em Materiais Semicondutores, Laboratório de Propriedades Ópticas, Instituto de Física, Universidade Federal da Bahia %@affiliation Instituto Nacional de Pesquisas Espaciais (INPE) %@affiliation Applied Materials Physics, Department of Materials Science and Engineering, Royal Institute of Technology %@affiliation Department of Physics, Linköping University %@affiliation Departamento de Física, Universidade Federal de Pernambuco %@affiliation Grupo de Dispositivos Nanoestruturados, Departamento de Física, Universidade Federal do Paraná %@affiliation Grupo de Física Básica e Aplicada em Materiais Semicondutores, Laboratório de Propriedades Ópticas, Instituto de Física, Universidade Federal da Bahia %@affiliation Grupo de Física Básica e Aplicada em Materiais Semicondutores, Laboratório de Propriedades Ópticas, Instituto de Física, Universidade Federal da Bahia %@affiliation Grupo de Física Básica e Aplicada em Materiais Semicondutores, Laboratório de Propriedades Ópticas, Instituto de Física, Universidade Federal da Bahia %B Journal of Non-Crystalline Solids %P 3734-3738 %4 sid.inpe.br/mtc-m16@80/2006/11.22.16.55 %D 2006 %V 352 %A Baroni, Mariana Pelissari Monteiro Aguiar, %A Conceição, M. Ventura, %A Rosa, Reinaldo Roberto, %A Persson, C., %A Arwin, H., %A Silva, E. F., %A Roman, L. S., %A Nakamura, O., %A Pepe, I., %A Silva, A. Ferreira da, %@dissemination WEBSCI; PORTALCAPES; COMPENDEX. %@area COMP